Surface Science Softwares : RHEED, LEED, AUGER, Labview, Virtual Surface Science Workstation, Scanning Electron Microscope, X-ray photoelectron spectroscopy, Scanning electron and AUGER microscopy, Electron Gun Controllers  
Auger electron spectroscopy
Auger data acquisition and processing software for Windows XP Professional, Vista, Windows 7 and Windows 8. Ideal for the RFA, CMA and Hemispherical electron analyser applications.

Auger Data Acquisition:
Full user choice of acquisition parameters
Multiple scan
Up to 10 acquisition scans per experiment
Repetitive fast scan mode for sample set up
Target current monitoring
Analogue mode for LIA acquisition
Digital mode with 20Mc/s counter for pulse counting application
Automatic save of data
Multiple spectrum display for comparison
Context sensitive help
Auto Zoom and Expand facility
Direct energy mapping to DAC
Auto and manual re-scaling during run

Minimum System Requirements:
Minimum: Intel Core processor with 4GB RAM
Windows XP Professional, Vista, Windows 7 and Windows 8
USB CCIR standard camera

Full 32/64 bit capabilities

Customised software and hardware

Auger Data Processing:

Savitzky-Golay fitting analysis
Background subtraction options
Peak half width determination
Spectrum addition and subtraction
Smoothing options
Manual despike facility
Integration and differentiation
Full annotation
Full bitmap save facility for spectrum

Fast scan and peak detector:
Peak finder for a fixed energy
Pause and continuous scan facility
Real time oscilloscope trace with dynamic parameters

For further information on this or any of our products please contact us.


RHEED : Reflection high energy electron diffraction LEED : Low energy electron diffraction Auger electron spectroscopy RHEED and LEED Gun Controllers Labview Virtual Surface Science Workstation SEM : Scanning electron microscope Specialised Electron Gun Controllers