Surface Science Softwares : RHEED, LEED, AUGER, Labview, Virtual Surface Science Workstation, Scanning Electron Microscope, X-ray photoelectron spectroscopy, Scanning electron and AUGER microscopy, Electron Gun Controllers  
LEED : Low Energy Electron Diffraction
Image/data aquisition and analysis. Fully integrated multitasking analysis software for Windows XP Professional, Vista, Windows 7 and Windows 8.
Imaging:
Real time image display, Single or multiple frames capture
Frame averaging and integration supported in all modes
Dynamic adjustment of brightness and contrast
Enhancement by background subtraction and contrast stretching (linear or non-linear)
Images exported as standard bitmaps
Capture movies to hard disk (up to 10fps)
Movies can be analysed later using all features of LEEDexpress, LEED Imaging or LEED Office
Options:
Computer
CCIR Camera and Time integration module
Customised software

Frame Grabbing:
Works with any CCIR standard camera
On-camera integration option using Cohu 4910 camera
Sync correction for VCRs
Wide range of black and white level adjustment
512X512 area from CCIR 768X576 frame

Minimum System Requirements:

Minimum: Intel Core processor with 4GB RAM
Windows XP Professional, Vista, Windows 7 and Windows 8
USB CCIR standard camera

Full 32/64 bit capabilities


Intensity Vs Energy I(V) Measurements:
Real time display of intensity and up to 18 spot positions
Record I(V) movie, measurements through movie features
Spot tracking manual, automatic and Template with variable retention intensity
R-Factor Analysis for crystal alignment
Average I(V) spectra


Spots and Profiles:

Multiple dynamic line profiles in any direciton
Real time line profiles
Manual or automatic spot and line management
Saturated spot diffusion
Automatic calculation of spot size
Peak locking on spot and Auto default size of spot

LEED Energy and Target Current:
Energy control 0-10V for 0eV to 1000eV(Programmable)
Target current and External input measurements

Intensity Vs Time I(t) Measurements:
Live display of time analysis
Playback I(t) measurements through movie feature
Smoothing

For further information on this or any of our products please contact us.

 
 
RHEED : Reflection high energy electron diffraction LEED : Low energy electron diffraction Auger electron spectroscopy RHEED and LEED Gun Controllers Labview Virtual Surface Science Workstation SEM : Scanning electron microscope Specialised Electron Gun Controllers