Surface Science Softwares : RHEED, LEED, AUGER, Labview, Virtual Surface Science Workstation, Scanning Electron Microscope, X-ray photoelectron spectroscopy, Scanning electron and AUGER microscopy, Electron Gun Controllers  
SAM : Scanning Electron and AUGER Microscopy
Image acquisition & processing surface science software for Windows XP Professional, Vista, Windows 7 and Windows 8

SEM and SAM image acquisition:
Full 32 bit image data
Dynamic scan display
Scanning speed adjustable for the
desired signal-to-noise ratio
64x64, 128x128, 256x256,
512x512, 1024x1024 display mode
Image input can be analog or digital
Load and save 32 bit facility
Auto dynamic range display
Adjustable gain
Interfaced with WinSpectro AUGER

Operation modes:
SAM mode
SEM mode
Single image
Continuous mode
Accumulative mode
Line scan

Image processing:

Exported as bit map (.bmp)

Computer interface
All necessary cables

SAM(Scanning electron and AUGER microscopy) - Image acquisition software for Windows XP™

System upgrades:
Gun controller

Minimum System Requirements:
Minimum: Intel Core processor with 4GB RAM
Windows XP Professional, Vista, Windows 7 and Windows 8

Full 32/64 bit capabilities

Download PDF

For further information on this or any of our products please contact us.

RHEED : Reflection high energy electron diffraction LEED : Low energy electron diffraction Auger electron spectroscopy RHEED and LEED Gun Controllers Labview Virtual Surface Science Workstation SEM : Scanning electron microscope Specialised Electron Gun Controllers