Surface Science Softwares : RHEED, LEED, AUGER, Labview, Virtual Surface Science Workstation, Scanning Electron Microscope, X-ray photoelectron spectroscopy, Scanning electron and AUGER microscopy, Electron Gun Controllers  
SEM : Scanning Electron Microscopy
Data acquisition and processing surface science software for Windows XP Professional, Vista, Windows 7 and Windows 8

SEM image acquisition:
Full 32 bit image data
Dynamic scan display
Scanning speed adjustable for the
desired signal-to-noise ratio
64x64, 128x128, 256x256,
512x512, 1024x1024 display mode
Image input can be analog or digital
Load and save 32 bit facility
Auto dynamic range display
Adjustable gain

Operation modes:
Single image
Continuous mode
Accumulative mode

SEM image processing:
Brightness
Contrast
Exported as bit map (.bmp)

Hardware:
Computer interface
All necessary cables

SEM(Scanning Electron Microscopy) - Image acquisition software for Windows XP™

System upgrades:
XP
SAMSEM
gun controller

Minimum System Requirements:

Minimum: Intel Core processor with 4GB RAM
Windows XP Professional, Vista, Windows 7 and Windows 8

Full 32/64 bit capabilities


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For further information on this or any of our products please contact us.

 
 
RHEED : Reflection high energy electron diffraction LEED : Low energy electron diffraction Auger electron spectroscopy RHEED and LEED Gun Controllers Labview Virtual Surface Science Workstation SEM : Scanning electron microscope Specialised Electron Gun Controllers