XPS - X-ray photoelectron spectroscopy
Data acquisition and processing surface science software for Windows XP Professional, Vista, Windows 7 and Windows 8

Auger and XPS data acquisition:
Full user choice of acquisition parameters
Software switch between XPS and AUGER mode
Two point energy calibration
Multiple scan run in a batch mode
Up to 10 acquisition scans per experiment
Repetitive fast scan mode for sample set up
Target current monitoring
Analogue mode for lock-in acquisition
Digital mode with 40Mc/s counter for pulse counting application
Automatic save of data
ASCII data for Excel import
Multiple spectrum display for comparison
Context sensitive help
Auto Zoom and Expand facility
Direct energy mapping to DAC
Auto and manual re-scaling during run

Operation modes:

Auger and XPS data processing:
Savitzky-Golay fitting analysis
Background subtraction options
Peak half width determination
Spectrum addition and subtraction
Smoothing options
Manual despike facility
Integration and differentiation
Full annotation
Full bitmap save facility for spectrum

Minimum System Requirements:
Minimum: Intel Core processor with 4GB RAM
Windows XP Professional, Vista, Windows 7 and Windows 8

Full 32/64 bit capabilities

XPS - Data acquisition and processing software for Windows XP™ and Vista™

Fast scan and peak detector:
Peak finder for a fixed energy
Pause and continuous scan facility
Real time oscilloscope trace
with dynamic parameters

Computer interface
All necessary cables

System upgrades:
Electron gun controller

For further information on this or any of our products please contact us.

RHEED : Reflection high energy electron diffraction LEED : Low energy electron diffraction Auger electron spectroscopy RHEED and LEED Gun Controllers Labview Virtual Surface Science Workstation SEM : Scanning electron microscope Specialised Electron Gun Controllers